Elimination of bistability in constant-phase mode in atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Phase imaging and stiffness in tapping-mode atomic force microscopy
The dependence of phase angles in tapping-mode atomic force microscopy on the magnitude of tip-sample repulsive interactions was investigated, and phase images of several hard and soft samples were recorded as a function of the free amplitude Ao and the set-point tapping amplitude Asp. The phase angle of probe oscillation increases with decreasing the set-point amplitude ratio Asp/Ao. Phase ima...
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Since the 1980s, atomic force microscopy (AFM) has rapidly developed into a versatile, high-resolution characterization technique, available in a variety of imaging modes. Within intermittent-contact tapping-mode, imaging bistability and sample mechanical damage continue to be two of the most important challenges faced daily by AFM users. Recently, a new double-control-loop tapping-mode imaging...
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We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFhif in liquid. Acoustic modes in the liquid excite the canti1eve.r. On soft samples, e.g., biolog...
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ژورنال
عنوان ژورنال: Chinese Science Bulletin
سال: 2012
ISSN: 1001-6538,1861-9541
DOI: 10.1007/s11434-011-4825-0